An Investigation of Wafer Probe Needles Mechanical Properties and Contact Resistance Changing Under Multiprobing Process | Semantic Scholar
99.95 99.98 Pure W Wre Tungsten Needle Probe C Type Straight Tungsten Tips Probe for Probe Card, Medical, IC Test, Welding, Discharge Gold Nickel Sn Plated - China 99.95 99.98 Tungsten Probe
Geometric parameter design of a cantilever probing needle used in epoxy ring probe card - ScienceDirect
Geometric design for ultra-long needle probe card for digital light processing wafer testing - ScienceDirect
Observation and Measurement of Probe Cards and Contact Probes | Electronic Device Industry | 4K Digital Microscope - Application Examples and Solutions | KEYENCE Singapore
Observation and Measurement of Probe Cards and Contact Probes | Electronic Device Industry | 4K Digital Microscope - Application Examples and Solutions | KEYENCE Singapore
International Contact Technologies Inc.
Probe Card Assembly | Alpha Probes
WPH Probe - Multi-contact DC Test Probe | FormFactor Inc.
For parallel-dice and full arrays
STAr Technologies and World Leading Foundry Collaborate to Complete the Development of Fine Pitch Probe Cards for Pre-Bumped Wafer Tests - EE Times Asia
JEM America Corp
Probe Card Cleaning “A Short Tutorial”
Ceramic Blade Probe - BITA ELECTRONIQUE S.A
Experimental characterization of wafer probe burn
23: Probe-card with 128 needles to test the inter-strip capacitance, of... | Download Scientific Diagram